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Modeling Nanoscale Imaging in Electron Microscopy

Author By : Thomas Vogt
Genres : 2012, Technical
Publisher : Springer
ISBN-10 : 146142190X
Pages : 275
Chapters :
Publish Date : March 2, 2012
File Type : PDF
Language : English
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Quick Overview

This book has been written after the series of workshops organized by the interdisciplinary mathematic institute and the Nano center. That is why the book has appealing feature that it has threaded the electron microscopes, engineers, physicists, and mathematicians together.

The book includes the 6 chapters that overcome the gap between high level mathematics and electron microscopy. The very first chapter of the book focus on the question that what is our perception about the nano structures and recommending about the fruitfulness of the Kantian approach and even it goes into the deep concept of application of the STEM for the nanoscale systems. For making readers learn about the beam sensitive samples author has used many case studies.

Later it put light on the reconstruction from atomic-resolution images of the wave at the exit surface of a specimen and enlightens the readers for work carried out using the computational and experimental resources of USC. Even fourth chapter has been illustrated framed for the information about the mathematical foundations of the compressed sensing that are applied to electron microscopy.

This book covers the authors’ globally consistent angular reconstitution approach for regenerating the macromolecule using electron microscopy. Applicability of work to the new generation of x-ray free-electron lasers, which has identical prospective applications and specify nicely the essentiality of applied mathematics in the physical sciences.

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